Scanning tunneling microscopy studies have been performed on GaAs homo
epitaxial films grown by molecular-beam epitaxy. Images show that in t
he earliest stages of deposition the morphology oscillates between one
with two-dimensional islands and flat terraces. After the initial tra
nsient regime, the system evolves to a dynamical steady state. This st
ate is characterized by a constant step density and as such the growth
mode can be termed step flow. Comparison with reflection high-energy
electron-diffraction (RHEED) shows that there is a direct corresponden
ce between the surface step density and the RHEED specular intensity.
Thick films (up to 1450 monolayers) display a slowly-increasing surfac
e roughness. Analysis of the scaling properties and comparison with th
eories of film growth will be made.