A. Fasolino et al., ELECTRONIC-STRUCTURE OF THIN SI LAYERS IN CAF2 - HYBRIDIZATION VERSUSCONFINEMENT, Solid-state electronics, 37(4-6), 1994, pp. 1145-1147
We present first principle calculations of thin (1-7 double layers) si
licon (111) layers in CaF2, a system with strong analogies to porous s
ilicon. We show that the Si band gap opening is dominated by the valen
ce band which follows the effective mass confinement picture, while th
e conduction band is found to flatten and shift very modestly due to h
ybridization effects between Si and Ca states which lead to bonding-an
tibonding interface states in the gap. The relevance of these results
for Si-based low dimensional structures is discussed.