ELECTRONIC-STRUCTURE OF THIN SI LAYERS IN CAF2 - HYBRIDIZATION VERSUSCONFINEMENT

Citation
A. Fasolino et al., ELECTRONIC-STRUCTURE OF THIN SI LAYERS IN CAF2 - HYBRIDIZATION VERSUSCONFINEMENT, Solid-state electronics, 37(4-6), 1994, pp. 1145-1147
Citations number
19
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
00381101
Volume
37
Issue
4-6
Year of publication
1994
Pages
1145 - 1147
Database
ISI
SICI code
0038-1101(1994)37:4-6<1145:EOTSLI>2.0.ZU;2-I
Abstract
We present first principle calculations of thin (1-7 double layers) si licon (111) layers in CaF2, a system with strong analogies to porous s ilicon. We show that the Si band gap opening is dominated by the valen ce band which follows the effective mass confinement picture, while th e conduction band is found to flatten and shift very modestly due to h ybridization effects between Si and Ca states which lead to bonding-an tibonding interface states in the gap. The relevance of these results for Si-based low dimensional structures is discussed.