Aa. Ptashchenko et al., POLARIZATION OF THE SPONTANEOUS RADIATION OF STRESSED LASER HETEROSTRUCTURES, Solid-state electronics, 37(4-6), 1994, pp. 1255-1258
Measurement system with a rotating polaroid was constructed allowing t
o detect the degree of the light polarization (rho) of 0.1% rho as a f
unction of driving current (I) and axial stress (sigma) was studied fo
r spontaneous output of the AlGaAs lasers at low pumping levels. It wa
s found that in the range of sufficiently small currents rho linearly
depends on I and sigma. When extrapolated to I = 0, rho depends not on
ly on sigma, but also on the light amplification parameters of the ind
ividual laser structure. These observations must be taken into account
when one attempts to estimate the strain in the active layer of a dio
de laser through the polarization measurements. The Cassidy's one-dime
nsional model of the polarization effects in diode lasers was modified
to include modulation of the optical absorption by the stimulated emi
ssion in the active region at very low pumping intensities.