X-RAY AND ELECTRICAL CHARACTERIZATION OF NASB2F7 SINGLE-CRYSTALS

Citation
Jb. Charles et al., X-RAY AND ELECTRICAL CHARACTERIZATION OF NASB2F7 SINGLE-CRYSTALS, Materials chemistry and physics, 38(4), 1994, pp. 337-341
Citations number
7
Categorie Soggetti
Material Science
ISSN journal
02540584
Volume
38
Issue
4
Year of publication
1994
Pages
337 - 341
Database
ISI
SICI code
0254-0584(1994)38:4<337:XAECON>2.0.ZU;2-A
Abstract
Single crystal X-ray analysis of NaSb2F7 have been carried out and cel l parameters are determined. From thermal analysis the weight loss, th ermal stability and decomposition temperatures have been determined. T he d.c. electrical conductivity of NaSb2F7 at (100), (010) and (001) o rientations have been carried out in the temperature range from 30 deg rees C to 175 degrees C. Dielectric constant (epsilon') and dielectric loss (tan delta) have been measured in the range from 0.1 KHz to 100 KHz and at temperatures between 30 degrees C to 175 degrees C.