A theory which includes the multiple low-angle inelastic scattering co
ntributions to convergent beam electron diffraction contrast is presen
ted. It is based on a slice model where many-beam Bragg scattering may
take place in the upper part, z, of the crystal. The inelastic electr
on scattering takes place in a slice dz at crystal thickness z, and th
ese electrons are then Bragg scattered in the lower part, (t - z), of
the crystal. The total intensity is obtained through an integration ov
er thickness and an addition of the separate contributions due to mult
iple inelastic scattering. Theoretical profiles for the individual pla
smon scattering contributions to the intensity have been calculated ac
ross the (220) CBED disk in Si for the systematic (220) case. The theo
retical calculations are compared to the corresponding experimental in
tensities obtained by an energy filtering system. The experimental res
ults are semi-quantitatively in good agreement with the calculations.
The main features after elastic as well as after one to four times pla
smon scattering are well reproduced by the theory.