SUBMICROMETER P-TYPE SIGE MODULATION-DOPED FIELD-EFFECT TRANSISTORS FOR HIGH-SPEED APPLICATIONS

Citation
I. Adesida et al., SUBMICROMETER P-TYPE SIGE MODULATION-DOPED FIELD-EFFECT TRANSISTORS FOR HIGH-SPEED APPLICATIONS, Microelectronic engineering, 35(1-4), 1997, pp. 257-260
Citations number
4
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
ISSN journal
01679317
Volume
35
Issue
1-4
Year of publication
1997
Pages
257 - 260
Database
ISI
SICI code
0167-9317(1997)35:1-4<257:SPSMFT>2.0.ZU;2-5
Abstract
Excellent improvement in the hole transport properties for SiGe hetero structures promises symmetric, higher speed, and lower power consumpti on circuits compared to conventional Si CMOS devices. Modulation-doped field effect transistors (MODFETs) grown on a relaxed Si0.7Ge0.3 buff er have been fabricated using a self-aligned gate process. The p-type devices had gate lengths ranging from 1.0 mu m down to 0.1 mu m A reco rd unity current gain cutoff frequency f(T) of 70 GHz was obtained for 0.1 mu m gate-length devices.