FABRICATION OF 10-NM SI PILLARS WITH SELF-FORMED ETCHING MASKS

Citation
T. Tada et al., FABRICATION OF 10-NM SI PILLARS WITH SELF-FORMED ETCHING MASKS, Microelectronic engineering, 35(1-4), 1997, pp. 293-296
Citations number
9
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
ISSN journal
01679317
Volume
35
Issue
1-4
Year of publication
1997
Pages
293 - 296
Database
ISI
SICI code
0167-9317(1997)35:1-4<293:FO1SPW>2.0.ZU;2-3
Abstract
It has been found that nanoscale etching masks self-form during plasma etching with SF, when the sample is kept at around -130 degrees C, at which condensation of the reaction products starts to occur. We have also found that if nucleation sites are present on the surface, the co ndensation occurs preferentially on the nucleation sites and the resul ting condensates act as etching masks, leading to the fabrication of S i nano-pillars. The above mechanism has been confirmed by fabrication of Si nanopillars using size-selected Ag clusters as condensation nucl ei.