In order to fabricate buried quantum structures using a total vacuum s
ystem which consists of low-energy focused ion beam and molecular beam
epitaxy systems, the effects of growth interruption, passivation by A
s layers on GaAs and annealing after growth are investigated experimen
tally using delta-doping technique in the GaAs. It is found that the a
nnealing at 800 degrees C for 10 s is not effective in reducing the in
terface states. It is concluded that the passivation by As layer is us
eful for the reduction of shallow interface state.