LOW-TEMPERATURE EPITAXIAL DEPOSITION OF ZNS ONTO (100)SI BY RF MAGNETRON SPUTTERING AND MOLECULAR-BEAM EPITAXY

Citation
Ip. Mcclean et al., LOW-TEMPERATURE EPITAXIAL DEPOSITION OF ZNS ONTO (100)SI BY RF MAGNETRON SPUTTERING AND MOLECULAR-BEAM EPITAXY, Journal of crystal growth, 143(3-4), 1994, pp. 172-175
Citations number
10
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
143
Issue
3-4
Year of publication
1994
Pages
172 - 175
Database
ISI
SICI code
0022-0248(1994)143:3-4<172:LEDOZO>2.0.ZU;2-G
Abstract
Single-crystal ZnS is deposited epitaxially onto (100)Si for the first time by RF magnetron sputtering as well as by molecular beam epitaxy. This is achieved using a novel, non-chemical, Si surface cleaning met hod which involved growing and then removing a thin layer of ZnS to re move the native SiO(2)layer found on Si surfaces. X-ray diffraction ev aluation indicates epitaxial growth occurring for films grown above 22 0 degrees C.