COMPOSITION PROFILES OF (HG,CD)TE LIQUID-PHASE EPITAXY LAYERS GROWN FROM TE-RICH SOLUTION

Citation
V. Jovic et al., COMPOSITION PROFILES OF (HG,CD)TE LIQUID-PHASE EPITAXY LAYERS GROWN FROM TE-RICH SOLUTION, Journal of crystal growth, 143(3-4), 1994, pp. 176-183
Citations number
22
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
143
Issue
3-4
Year of publication
1994
Pages
176 - 183
Database
ISI
SICI code
0022-0248(1994)143:3-4<176:CPO(LE>2.0.ZU;2-M
Abstract
The paper presents a theoretical model enabling numerical calculation of composition profiles in liquid phase epitaxial Hg1-xCdxTe layers gr own from semi-infinite Te-rich solutions. The layers x less than or eq ual to 0.3 were grown on CdTe substrates, in a two-zone, semiclosed sy stem in which Hg leakage was eliminated. The model combines two mechan isms which cause the appearance of a concentration gradient in the epi taxial layers-non-constant temperature crystallization of three-compou nd solid solution and interdiffusion between substrate and growing lay er. It is applicable to the following standard liquid phase epitaxy gr owth techniques: step cooling, supercooling and equilibrium cooling.