A NEW INCREASING FAILURE RATE MODEL FOR LIFE TIME DATA

Authors
SIDDIQUI SA NANDAN D GUPTA S SUBHARWAL M
Citation
Sa. Siddiqui et al., A NEW INCREASING FAILURE RATE MODEL FOR LIFE TIME DATA, Microelectronics and reliability, 35(1), 1995, pp. 109-111
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Microelectronics and reliability → ACNP
ISSN journal
00262714
Volume
35
Issue
1
Year of publication
1995
Pages
109 - 111
Database
ISI
SICI code
0026-2714(1995)35:1<109:ANIFRM>2.0.ZU;2-9
Abstract
A versatile failure model is being developed in the present article an d its various properties are discussed. The model belongs to the expon ential family. For illustration, numerical data are presented which fi t the model.