SURFACE-MORPHOLOGY STUDY ON CDZNTE SINGLE-CRYSTALS BY ATOMIC FORCE MICROSCOPY

Citation
M. Azoulay et al., SURFACE-MORPHOLOGY STUDY ON CDZNTE SINGLE-CRYSTALS BY ATOMIC FORCE MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(2), 1993, pp. 148-151
Citations number
12
ISSN journal
10711023
Volume
11
Issue
2
Year of publication
1993
Pages
148 - 151
Database
ISI
SICI code
1071-1023(1993)11:2<148:SSOCSB>2.0.ZU;2-W
Abstract
The study of the crystal surface morphology of CdZnTe is important for the understanding of the fundamentals of crystal growth in order to i mprove the crystal quality which is essential in applications such as substrates for epitaxy or performance of devices, i.e., room temperatu re nuclear spectrometers. We present here a first atomic force microsc opy study on CdZnTe. Cleaved (110) surfaces were imaged in the ambient and an atomic layer step structure was revealed. The effects of therm al annealing on the atomic steps together with Te precipitation along these steps are discussed in terms of deformation due to stress relief and the diffusion of tellurium precipitates.