M. Azoulay et al., SURFACE-MORPHOLOGY STUDY ON CDZNTE SINGLE-CRYSTALS BY ATOMIC FORCE MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(2), 1993, pp. 148-151
The study of the crystal surface morphology of CdZnTe is important for
the understanding of the fundamentals of crystal growth in order to i
mprove the crystal quality which is essential in applications such as
substrates for epitaxy or performance of devices, i.e., room temperatu
re nuclear spectrometers. We present here a first atomic force microsc
opy study on CdZnTe. Cleaved (110) surfaces were imaged in the ambient
and an atomic layer step structure was revealed. The effects of therm
al annealing on the atomic steps together with Te precipitation along
these steps are discussed in terms of deformation due to stress relief
and the diffusion of tellurium precipitates.