Hj. Fitting, VACUUM EMISSION OF HOT-ELECTRONS FROM INSULATING AND SEMICONDUCTING-FILMS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(2), 1993, pp. 433-436
Monte Carlo calculations and vacuum emission experiments have been sho
wn to be powerful tools to investigate the high field electronic trans
port in metal-insulator-semiconductor and metal-semiconductor-insulato
r-semiconductor layer devices. Direct proof of hot-electron accelerati
on in semiconducting ZnS:Mn electroluminescent layers by means of vacu
um emission and energy analysis in a spherical grid analyzer has been
given as it was earlier for insulating a layer of SiO2. The energy dis
tributions show strong peaking in the low-energy region around 3 eV as
well as a high-energy tail exceeding even 20 eV. The enhanced emissio
n of low-energy electrons with increasing field F indicates impact val
ence band excitation and direct avalanching in thin insulating and sem
iconducting films of sufficient thickness, than it has been predicted
by strong acoustic phonon coupling and intervalley scattering.