H. Loschner et al., ION PROJECTION LITHOGRAPHY FOR VACUUM MICROELECTRONICS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(2), 1993, pp. 487-492
Ion projection lithography has the advantage of demagnifying ion-optic
al mask-to-wafer pattern transfer with sub-0.1 mum resolution and larg
e depth of focus (> 10 mum). There is the possibility of electronic al
ignment (''pattern lock'') of the projected ion image on-line during c
hip exposure with nanometer precision. Potential application areas of
ion projection lithography include high volume silicon and GaAs chip f
abrication and, implementing exposure field stitching and electrostati
c step exposure techniques, the manufacture of flat panel devices base
d on vacuum microelectronics.