ION PROJECTION LITHOGRAPHY FOR VACUUM MICROELECTRONICS

Citation
H. Loschner et al., ION PROJECTION LITHOGRAPHY FOR VACUUM MICROELECTRONICS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(2), 1993, pp. 487-492
Citations number
15
ISSN journal
10711023
Volume
11
Issue
2
Year of publication
1993
Pages
487 - 492
Database
ISI
SICI code
1071-1023(1993)11:2<487:IPLFVM>2.0.ZU;2-W
Abstract
Ion projection lithography has the advantage of demagnifying ion-optic al mask-to-wafer pattern transfer with sub-0.1 mum resolution and larg e depth of focus (> 10 mum). There is the possibility of electronic al ignment (''pattern lock'') of the projected ion image on-line during c hip exposure with nanometer precision. Potential application areas of ion projection lithography include high volume silicon and GaAs chip f abrication and, implementing exposure field stitching and electrostati c step exposure techniques, the manufacture of flat panel devices base d on vacuum microelectronics.