The paper deals with the-metrological analysis of capacitive thin-film
humidity sensors based on a heuristic transient and failure response
model. Characteristic quantities can be derived from the seperation of
both dynamic and static and determined and stochastic parts of output
voltage to create a comparing basis for the properties of these senso
rs. The quantity of measurement errors caused by stochastic humidity s
timulation will be shown. One of the investigated sensors shows a very
determined transient response, which allows a dynamic correction as u
sual in the case of temperature sensors.