We have used an optical reflection technique to measure the thickness
of water films existing on the surfaces of isolated single H2O ice cry
stals, at temperatures below 0-degrees-C. The crystals were grown in s
itu from pure water vapor. When investigated under these conditions th
e water films were found to be of finite thickness at all T up to and
including the triple point, indicating incomplete wetting of water on
ice, or incomplete surface melting. The maximum film thickness detecte
d was approximately 200 angstrom. At T(TR) water drops appeared on the
ice facets, observed by interference microscopy. Their contact angles
were consistent with the above findings. The addition of air to the a
tmosphere caused the film thickness to diverge on some orientations of
the surface, i.e. it caused complete wetting or complete surface melt
ing.