Y. Chikaura et Y. Suzuki, X-RAY RECONSTRUCTION TOPOGRAPHY FOR OBSERVATION OF THE ORIENTATION DISTRIBUTION IN A SINGLE-CRYSTAL, Journal of applied crystallography, 26, 1993, pp. 219-225
A microcomputer-assisted reconstruction topography technique has been
devised for observation of the distribution of subgrain orientations i
n a single crystal. The orientation at a specific location is computed
, with data from X-ray scattering topographs, by a microcomputer. The
reconstruction topograph showing the orientation distribution consists
of two topographs, one showing the rotation-angle distribution around
an axis and the other the orientation distribution of the rotation ax
is. The system capability has been demonstrated by observations of an
iron-3wt% silicon alloy with an orientational resolution of 2.0' and a
spatial resolution of less than 48 mum. Emphasis is placed on the fac
t that this is the first proposal for X-ray topography involving spect
roscopy.