We discriminate between the charged and neutral character of Ge/III-V
semiconductor interfaces by examining the band discontinuities across
each interface in AlAs-Ge-GaAs(001) and GaAs-Ge-AlAs(001) single quant
um well structures as a function of Ge thickness in the 2-16 monolayer
range and comparing them with those of individual, isolated Ge-GaAs(0
01), Ge-AlAs(001), GaAs-Ge(001) and AlAs-Ge(001) heterojunctions. All
structures were grown by molecular beam epitaxy at 360-degrees-C and e
xamined in situ by X-ray photoemission spectroscopy. While ideally abr
upt polar heterovalent interfaces are predicted to be charged, we find
that all of the observed deviations from the commutativity and transi
tivity rules of heterojunction band offsets are consistent with the es
tablishment of inequivalent, neutral IV/III-V and III-V/IV interfaces.