Mg. Proietti et al., MICROSCOPIC INVESTIGATION OF THE STRAIN DISTRIBUTION IN INGAAS GAAS QUANTUM-WELL STRUCTURES GROWN BY MOLECULAR-BEAM EPITAXY/, Journal of crystal growth, 127(1-4), 1993, pp. 592-595
Extended X-ray absorption fine structure in the glancing angle geometr
y has been used to study the strain accommodation in quantum well stru
ctures of InxGa1-xAs/GaAs (x < 0.25). The results show that a number o
f Ga-As bond lengths are stretched. Indeed, two Ga-As bonds distances
coexist: 2.45 +/- 0.01 angstrom and 2.64 +/- 0.02 angstrom, which corr
espond to the Ga-As and In-As bond distances in the binary compounds G
aAs and InAs, respectively. This result is independent of the In molar
fraction in the strained alloy layers.