INVESTIGATION OF MBE-GROWN HIGH-TC FILMS BY RHEED, ATOMIC FORCE MICROSCOPY AND X-RAY-DIFFRACTION

Authors
WANG HS EISSLER D DIETSCHE W FISCHER A PLOOG K
Citation
Hs. Wang et al., INVESTIGATION OF MBE-GROWN HIGH-TC FILMS BY RHEED, ATOMIC FORCE MICROSCOPY AND X-RAY-DIFFRACTION, Journal of crystal growth, 127(1-4), 1993, pp. 655-658
Citations number
6
Categorie Soggetti
Crystallography
Journal title
Journal of crystal growth → ACNP
ISSN journal
00220248
Volume
127
Issue
1-4
Year of publication
1993
Pages
655 - 658
Database
ISI
SICI code
0022-0248(1993)127:1-4<655:IOMHFB>2.0.ZU;2-Q
Abstract
Results on the preparation of the molecular beam epitaxial (MBE) growt h and on structural investigations of high T(c) DyBa2Cu3O7-y (DBCO) su perconducting thin films are presented. We prepared high quality DBCO thin films on SrTiO3, MgO, LaAlO3 and NdGaO3 substrates in situ with h igh reproducibility. We also grew DBCO/Dy2O3/DBCO/SrTiO3 multilayer st uctures. The structure and morphology of the films were studied by RHE ED, STM, AFM, XRD and X-ray Weissenberg camera techniques.