Tim. Bootsma et T. Hibma, A STRAIN-RELIEVE TRANSITION IN EPITAXIAL-GROWTH OF METALS ON SI(111)(7X7), Journal of crystal growth, 127(1-4), 1993, pp. 678-681
Pronounced RHEED specular beam intensity oscillations have been observ
ed during the growth of several metals on a Si(111)(7 X 7) substrate a
t low temperature (100 K), showing that the metals grow in a layer-by-
layer fashion. For all metals studied three regimes can be distinguish
ed. Up to one or two monolayers the variation of the reflected intensi
ty is due to changes in the surface structure rather than surface morp
hology. Next, a limited number of oscillations with an ill-defined per
iod appears. Most surprisingly, however, in most cases a sudden reviva
l of the oscillations with a much more regular period is observed. It
is suggested that this phenomenon is caused by a transition from a lat
tice-matched to a relaxed layer-by-layer growth mechanism.