TILTED SUPERLATTICE COMPOSITION PROFILE MEASURED BY PHOTOLUMINESCENCEAND RAMAN

Citation
Fg. Johnson et al., TILTED SUPERLATTICE COMPOSITION PROFILE MEASURED BY PHOTOLUMINESCENCEAND RAMAN, Journal of crystal growth, 127(1-4), 1993, pp. 812-815
Citations number
12
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
127
Issue
1-4
Year of publication
1993
Pages
812 - 815
Database
ISI
SICI code
0022-0248(1993)127:1-4<812:TSCPMB>2.0.ZU;2-W
Abstract
The composition profile of an (AlAs)1/2(GaAs)1/2 tilted superlattice w as determined to be sinusoidal, varying from Al0.4Ga0.6As to Al0.6Ga0. 4As. The energy and polarization of the direct and indirect band gap p hotoluminescence were examined before and after thermally induced diso rdering. The shift of the direct band gap photoluminescence peak was m easured as a function of layer interdiffusion and compared to a theore tical model to find the composition profile. Raman spectroscopy was us ed to measure the linewidths of the tilted superlattice longitudinal o ptic phonons. These linewidths were compared to those from a uniform a lloy and a conventional superlattice. The data support the assignment of a sinusoidal composition profile to the tilted superlattice.