Fg. Johnson et al., TILTED SUPERLATTICE COMPOSITION PROFILE MEASURED BY PHOTOLUMINESCENCEAND RAMAN, Journal of crystal growth, 127(1-4), 1993, pp. 812-815
The composition profile of an (AlAs)1/2(GaAs)1/2 tilted superlattice w
as determined to be sinusoidal, varying from Al0.4Ga0.6As to Al0.6Ga0.
4As. The energy and polarization of the direct and indirect band gap p
hotoluminescence were examined before and after thermally induced diso
rdering. The shift of the direct band gap photoluminescence peak was m
easured as a function of layer interdiffusion and compared to a theore
tical model to find the composition profile. Raman spectroscopy was us
ed to measure the linewidths of the tilted superlattice longitudinal o
ptic phonons. These linewidths were compared to those from a uniform a
lloy and a conventional superlattice. The data support the assignment
of a sinusoidal composition profile to the tilted superlattice.