Si-doped GaAs has been grown on (111)A and (111)A vicinal GaAs substra
tes and carrier concentrations measured for a range of Si fluxes and g
rowth temperatures. The use of As2 as opposed to As4 has been examined
. These results are discussed with respect to the growth mechanisms. P
hotoluminescence measurements have been made and compared with growth
on an (001) substrate. The nature of the lattice site of incorporated
Si is confirmed using local vibrational mode measurements.