L. Daweritz et al., SELF-ORGANIZATION DURING SI INCORPORATION IN MBE-GROWN VICINAL GAAS(001) SURFACES, Journal of crystal growth, 127(1-4), 1993, pp. 1051-1055
The attachment kinetics of Si atoms at MiSorientation steps on vicinal
GaAs(001) surfaces tilted toward the (111)Ga plane has been studied b
y real-time RHEED measurements. For a misorientation of 2-degrees and
a substrate temperature of 580-degrees-C it is demonstrated that a sel
f-organized in-plane incorporation of Si atoms takes place. The surfac
e with a wire-like arrangement of the Si atoms can be overgrown by GaA
s without adverse effects on the growth front.