REM STUDIES OF SURFACE CRYSTALLOGRAPHY

Reflection electron microscopy (REM) allows a very accurate determinat ion of crystallographic directions on a surface. The lack of resolutio n in REM due to foreshortening is compensated by enhanced sensitivity for measuring angular differences of these directions. This is shown b y sequences of atomic steps on Pt(100). The lattice of reconstruction on (100) and (111) surfaces of gold could directly be imaged with a se paration of approximately 4.0 nm and 6.7 nm, respectively.