REFLECTION ELECTRON HOLOGRAPHIC OBSERVATION OF SURFACE DISPLACEMENT FIELD

Citation
N. Osakabe et al., REFLECTION ELECTRON HOLOGRAPHIC OBSERVATION OF SURFACE DISPLACEMENT FIELD, Ultramicroscopy, 48(4), 1993, pp. 483-488
Citations number
12
Categorie Soggetti
Microscopy
Journal title
ISSN journal
03043991
Volume
48
Issue
4
Year of publication
1993
Pages
483 - 488
Database
ISI
SICI code
0304-3991(1993)48:4<483:REHOOS>2.0.ZU;2-1
Abstract
Reflection electron holography was applied to the observation of the s urface displacement field induced by a dislocation. The detailed surfa ce topography including the terminating step height was quantitatively observed. The effect of diffraction phase shift on the measurement wa s estimated based on the columnar approximation with phase calculation by matrix formulation of the dynamical theory. The result shows the d iffraction phase shift does not affect the surface topography observat ion except for the core region of the dislocation.