CHARACTERISTICS OF GAN STRIPES GROWN BY SELECTIVE-AREA METALORGANIC CHEMICAL-VAPOR-DEPOSITION
Citation
X. Li et al., CHARACTERISTICS OF GAN STRIPES GROWN BY SELECTIVE-AREA METALORGANIC CHEMICAL-VAPOR-DEPOSITION, Journal of electronic materials, 26(3), 1997, pp. 306-310
Categorie Soggetti
Engineering, Eletrical & Electronic","Material Science
SICI code
0361-5235(1997)26:3<306:COGSGB>2.0.ZU;2-Y
Abstract
We report on the selective-area metalorganic chemical vapor deposition
of GaN stripes in the size range of 50 to 125 mu m and the characteri
zation of the morphology, topography, and optical properties of these
stripes. GaN films (similar to 1-3 mu m) grown on (0001) sapphire are
used as the substrates. Excellent surface morphology is achieved under
optimized growth conditions which include a higher V/III ratio than b
road area growth. It is found that, under certain growth conditions, (
0001) terraces of similar to 5 mu m in width develop at the edges of a
ll stripes, independent of stripe size and orientation. The selectivel
y grown GaN yields stronger band-edge emission than the ''substrate''
GaN which indicates an improvement in optical quality. However, the do
nor-acceptor pair recombination (or conduction band to acceptor transi
tion) and yellow emission are also enhanced in certain areas of the st
ripes, The spatial correlation of these emission bands is established
by cathodoluminescence wavelength imaging, and the origin of these emi
ssions is speculated.