Jr. Maldonado et al., EFFECT OF CYLINDRICAL SPOT SHAPE IN GAS PLASMA SOURCES FOR X-RAY-LITHOGRAPHY, Microelectronic engineering, 21(1-4), 1993, pp. 107-112
The effect of an x-ray emitting spot with cylindrical symmetry in gas
plasma sources is studied using the XMAS x-ray lithography program tak
ing into account variations of x-ray illumination on the exposed wafer
. These divergence effects may affect the process latitude across the
exposure field. Maximum limits in the dimensions of the cylindrical x-
ray source are determined using the XMAS simulation. The effective x-r
ay source size of the Science Research laboratories plasma source was
measured using the appropriate filters to simulate x-ray lithography.
The experimental results indicate that no adverse divergence effects s
hould be expected in a 4.4 cm diameter exposure field at 63.5 cm from
the source.