K. Bornig et J. Pelka, SIMULATION OF TIME DEPENDING PARTICLE-TRANSPORT DURING DRY ETCH PROCESS, Microelectronic engineering, 21(1-4), 1993, pp. 325-328
Energy and angular distributions of ions at the substrate electrode ar
e computed with a Monte-Carlo-Simulation, accounting for charge transf
er collisions and elastic scattering via differential cross sections.
The time dependent electric field the ions react on is calulated with
an extended hydrodynamical theory, that is valid for the whole pressur
e range including those that is relevant for RIE pocessing. The influe
nce of the scattering processes on etch profiles is estimated from the
calculated distributions.