AN INVESTIGATION INTO THE EFFECTS OF A PATH-LENGTH OFFSET ON A COHERENCE PROBE MICROSCOPE

Authors
DAVIES GS HOLWILL RJ
Citation
Gs. Davies et Rj. Holwill, AN INVESTIGATION INTO THE EFFECTS OF A PATH-LENGTH OFFSET ON A COHERENCE PROBE MICROSCOPE, Microelectronic engineering, 21(1-4), 1993, pp. 367-370
Citations number
NO
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
Microelectronic engineering → ACNP
ISSN journal
01679317
Volume
21
Issue
1-4
Year of publication
1993
Pages
367 - 370
Database
ISI
SICI code
0167-9317(1993)21:1-4<367:AIITEO>2.0.ZU;2-R