CRYSTALLOGRAPHIC EVALUATION OF ZNSE CRYSTALS BY X-RAY-DIFFRACTION

Crystallographic quality and the lattice constant of ZnSe crystals gro wn from Te/Se solutions by the temperature gradient solution growth me thod were evaluated by using a high resolution x-ray diffractometer. T he full width at half maximum of the x-ray rocking curve was 5.7 sec, a value almost equivalent to that of GaAs. The distribution of crystal lographic properties along the growth direction was nearly the same ex cepting just on the heat-sink. The accurate lattice constant of the Zn Se crystal measured by this system was 5.6700 +/-0.000025 A.