PERFORMANCE-RELATED RELIABILITY-MEASURES FOR A REPAIRABLE 2-UNIT GRACEFULLY DEGRADING SYSTEM

Citation
M. Agarwal et M. Mahajan, PERFORMANCE-RELATED RELIABILITY-MEASURES FOR A REPAIRABLE 2-UNIT GRACEFULLY DEGRADING SYSTEM, Microelectronics and reliability, 33(7), 1993, pp. 921-927
Citations number
8
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00262714
Volume
33
Issue
7
Year of publication
1993
Pages
921 - 927
Database
ISI
SICI code
0026-2714(1993)33:7<921:PRFAR2>2.0.ZU;2-J
Abstract
The system analysed is a two-unit gracefully degrading system with rep air. After each repair, the unit is tested to see if the repair meets certain predefined specifications. If it does, the unit is put to oper ation, otherwise it goes to post-repair. The failure-time and testing- time distributions are exponential whereas all other distributions are arbitrary. The technique of embedded SMP is employed to obtain severa l system performance parameters, namely, MTFF (mean time to first fail ure), availability, computational availability, expected number of vis its to a certain state etc.