M. Agarwal et M. Mahajan, PERFORMANCE-RELATED RELIABILITY-MEASURES FOR A REPAIRABLE 2-UNIT GRACEFULLY DEGRADING SYSTEM, Microelectronics and reliability, 33(7), 1993, pp. 921-927
The system analysed is a two-unit gracefully degrading system with rep
air. After each repair, the unit is tested to see if the repair meets
certain predefined specifications. If it does, the unit is put to oper
ation, otherwise it goes to post-repair. The failure-time and testing-
time distributions are exponential whereas all other distributions are
arbitrary. The technique of embedded SMP is employed to obtain severa
l system performance parameters, namely, MTFF (mean time to first fail
ure), availability, computational availability, expected number of vis
its to a certain state etc.