REALIZATION OF A MIXED-TYPE OF INTERFEROMETRY USING CONVERGENT-BEAM ELECTRON-DIFFRACTION AND AN ELECTRON BIPRISM

Citation
Ra. Herring et al., REALIZATION OF A MIXED-TYPE OF INTERFEROMETRY USING CONVERGENT-BEAM ELECTRON-DIFFRACTION AND AN ELECTRON BIPRISM, Ultramicroscopy, 50(1), 1993, pp. 94-100
Citations number
6
Categorie Soggetti
Microscopy
Journal title
ISSN journal
03043991
Volume
50
Issue
1
Year of publication
1993
Pages
94 - 100
Database
ISI
SICI code
0304-3991(1993)50:1<94:ROAMOI>2.0.ZU;2-D
Abstract
A new method of interferometry has been realized using a transmission electron microscope with a stable field emission gun, electron biprism and specimen holder. The method involves interfering diffracted beams from a crystal by use of an electron biprism. The interferograms prod uced provide information about the crystal. Use of a small electron pr obe affords structural information about the crystal at the atomic lev el.