Ra. Herring et al., REALIZATION OF A MIXED-TYPE OF INTERFEROMETRY USING CONVERGENT-BEAM ELECTRON-DIFFRACTION AND AN ELECTRON BIPRISM, Ultramicroscopy, 50(1), 1993, pp. 94-100
A new method of interferometry has been realized using a transmission
electron microscope with a stable field emission gun, electron biprism
and specimen holder. The method involves interfering diffracted beams
from a crystal by use of an electron biprism. The interferograms prod
uced provide information about the crystal. Use of a small electron pr
obe affords structural information about the crystal at the atomic lev
el.