ROBUST CHARACTER OF EXPONENTIAL SPRT

Authors
SHARMA KK RANA RS
Citation
Kk. Sharma et Rs. Rana, ROBUST CHARACTER OF EXPONENTIAL SPRT, Microelectronics and reliability, 33(9), 1993, pp. 1223-1225
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Microelectronics and reliability → ACNP
ISSN journal
00262714
Volume
33
Issue
9
Year of publication
1993
Pages
1223 - 1225
Database
ISI
SICI code
0026-2714(1993)33:9<1223:RCOES>2.0.ZU;2-8
Abstract
The system or device may be guaranteed up to a certain period. This pe riod is variable because of environmental factors such as vibrations, shocks and pressures etc. This variation has an obvious bearing for th e interest of the producer and the consumer. The present paper analyse s the robustness of two-parameter exponential SPRT with respect to ris ks and average sample number (ASN) when the guaranteed-time parameter undergoes a change.