THE RELIABILITY MODEL ON A 2-STAGE CIMS PRODUCTION LINE

Authors
MIN T
Citation
T. Min, THE RELIABILITY MODEL ON A 2-STAGE CIMS PRODUCTION LINE, Microelectronics and reliability, 33(9), 1993, pp. 1275-1280
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Microelectronics and reliability → ACNP
ISSN journal
00262714
Volume
33
Issue
9
Year of publication
1993
Pages
1275 - 1280
Database
ISI
SICI code
0026-2714(1993)33:9<1275:TRMOA2>2.0.ZU;2-G
Abstract
This paper presents the reliability model on two stage CIMS production line, analyzes two numerical examples.