STUDY OF POTASSIUM TITANYL PHOSPHATE (KTP) FLUX GROWTH BY HOLOGRAPHICPHASE-CONTRAST INTERFEROMETRIC MICROPHOTOGRAPHY

This paper describes a special set of equipment we designed, which is suitable to be used to study the high temperature solution growth proc ess by optical method. The variation regularities of the solid-liquid interface boundary layer in the potassium titanyl phosphate (KTP) crys tal growth and dissolution process have been investigated by holograph ic phase-contrast interferometric microphotography. It has been found that under the condition of free convection, the relation between the thickness of the boundary layer and supersaturation is linear. Moreove r, the variation of refractive index caused by the change of solute co ncentration in the boundary layer will form an exponential function of the distance from the crystal face.