THE APPLICATION OF SYNCHROTRON X-RAY TECHNIQUES TO PROBLEMS IN CRYSTAL SCIENCE AND ENGINEERING

The basic physical principles underlying synchrotron radiation generat ion and related experimental techniques are outlined together with an appraisal of their utility in the characterization of some of the stru ctural aspects associated with crystal growth and related processes. T he paper provides an overview of some recent studies through a number of case examples: extended X-ray absorption fine structure (EXAFS) and its application to studies of the local environment around surface ox ides and extrinsic dopants in group III-V semiconductors; X-ray standi ng waves and their application to studies of ionically adsorbed crysta l habit modifiers; dynamic X-ray powder diffraction and its applicatio ns to the in-situ examination of the solution crystallization of n-alk anes and the electrochemical crystallization of PbO2; X-ray Laue topog raphy and its application to the characterization of crystal lattice d efects; high resolution X-ray multiple diffraction and its use in prob ing lattice coherence in compound semiconductor multilayers; the use o f surface X-ray diffraction to examine structural order at the crystal solution interface. Current trends and likely future developments in these and related techniques are outlined.