PARAMETERS FOR HIGH-RESOLUTION ELECTRON HOLOGRAPHY

Authors
Citation
H. Lichte, PARAMETERS FOR HIGH-RESOLUTION ELECTRON HOLOGRAPHY, Ultramicroscopy, 51(1-4), 1993, pp. 15-20
Citations number
21
Categorie Soggetti
Microscopy
Journal title
ISSN journal
03043991
Volume
51
Issue
1-4
Year of publication
1993
Pages
15 - 20
Database
ISI
SICI code
0304-3991(1993)51:1-4<15:PFHEH>2.0.ZU;2-6
Abstract
Theoretically, the idea of electron holography is straightforward: the electron image wave is recorded in a hologram and reconstructed by su bsequent processing according to the laws of wave optics. However, in particular at high resolution, the experimental realization is restric ted, e.g. by the limited coherence, i.e. the brightness of electron be ams, pixel number available with today's image-processing systems. By careful consideration of the role of the parameters during taking and reconstructing a high-resolution hologram, nevertheless, a resolution limit of 0.1 nm seems to come within reach with available technology.