ELECTRON-SPIN-RESONANCE AND INSTABILITIES IN METAL-INSULATOR-SEMICONDUCTOR SYSTEMS

Authors
LENAHAN PM
Citation
Pm. Lenahan, ELECTRON-SPIN-RESONANCE AND INSTABILITIES IN METAL-INSULATOR-SEMICONDUCTOR SYSTEMS, Microelectronic engineering, 22(1-4), 1993, pp. 129-138
Citations number
NO
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
Microelectronic engineering → ACNP
ISSN journal
01679317
Volume
22
Issue
1-4
Year of publication
1993
Pages
129 - 138
Database
ISI
SICI code
0167-9317(1993)22:1-4<129:EAIIM>2.0.ZU;2-5
Abstract
Electron spin resonance measurements combined with electrical measurem ents provide an ''atomic scale'' understanding of trapping centers in amorphous insulating thin films and their interfaces with silicon.