EFFECTS OF HYDROGEN ANNEALING AFTER CHANNEL HOT-CARRIER STRESS

Authors
SAKS NS KLEIN RB
Citation
Ns. Saks et Rb. Klein, EFFECTS OF HYDROGEN ANNEALING AFTER CHANNEL HOT-CARRIER STRESS, Microelectronic engineering, 22(1-4), 1993, pp. 265-268
Citations number
NO
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
Microelectronic engineering → ACNP
ISSN journal
01679317
Volume
22
Issue
1-4
Year of publication
1993
Pages
265 - 268
Database
ISI
SICI code
0167-9317(1993)22:1-4<265:EOHAAC>2.0.ZU;2-V