Cc. Chin et al., THE INFLUENCE OF THE SURFACE-ROUGHNESS OF THE SUBSTRATES ON THE SURFACE-MORPHOLOGY OF YBA2CU3O7-X THIN-FILMS, Journal of crystal growth, 132(1-2), 1993, pp. 82-90
Different degrees of roughness were introduced to the surface of the s
ubstrates by HCI or oxygen plasma etching. The films were deposited by
laser ablation. The surface morphology of the films of different thic
knesses deposited on the annealed and etched substrates perpendicular
to c-axis was compared to show the influence of the surface roughness
of the surface on the growth of films. For SrTiO3, a substrate surface
roughness of peak-valley height of 10-20 angstrom was found not to in
crease the density of outgrowths but a roughness of 50 angstrom increa
sed the density tremendously. For MgO, a roughness of 30-50 angstrom i
ncreased the density of outgrowths significantly. The surface morpholo
gy of films on MgO and SrTiO3 substrates (annealed and etched) was com
pared to clarify the effect of a lattice mismatch. The density of outg
rowths on the films on MgO was found to be much lower than that on SrT
iO3 for both the cases of annealed and etched substrates. This differe
nce was discussed in relation to the origin of outgrowths.