THE INFLUENCE OF THE SURFACE-ROUGHNESS OF THE SUBSTRATES ON THE SURFACE-MORPHOLOGY OF YBA2CU3O7-X THIN-FILMS

Citation
Cc. Chin et al., THE INFLUENCE OF THE SURFACE-ROUGHNESS OF THE SUBSTRATES ON THE SURFACE-MORPHOLOGY OF YBA2CU3O7-X THIN-FILMS, Journal of crystal growth, 132(1-2), 1993, pp. 82-90
Citations number
3
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
132
Issue
1-2
Year of publication
1993
Pages
82 - 90
Database
ISI
SICI code
0022-0248(1993)132:1-2<82:TIOTSO>2.0.ZU;2-F
Abstract
Different degrees of roughness were introduced to the surface of the s ubstrates by HCI or oxygen plasma etching. The films were deposited by laser ablation. The surface morphology of the films of different thic knesses deposited on the annealed and etched substrates perpendicular to c-axis was compared to show the influence of the surface roughness of the surface on the growth of films. For SrTiO3, a substrate surface roughness of peak-valley height of 10-20 angstrom was found not to in crease the density of outgrowths but a roughness of 50 angstrom increa sed the density tremendously. For MgO, a roughness of 30-50 angstrom i ncreased the density of outgrowths significantly. The surface morpholo gy of films on MgO and SrTiO3 substrates (annealed and etched) was com pared to clarify the effect of a lattice mismatch. The density of outg rowths on the films on MgO was found to be much lower than that on SrT iO3 for both the cases of annealed and etched substrates. This differe nce was discussed in relation to the origin of outgrowths.