INTEGRATED ELECTROCERAMICS - DENSIFICATION AND STRESS DEVELOPMENT IN SOL-GEL DERIVED THIN-LAYERS

Citation
Ss. Sengupta et al., INTEGRATED ELECTROCERAMICS - DENSIFICATION AND STRESS DEVELOPMENT IN SOL-GEL DERIVED THIN-LAYERS, Integrated ferroelectrics, 14(1-4), 1997, pp. 193-200
Citations number
13
Categorie Soggetti
Physics, Condensed Matter","Engineering, Eletrical & Electronic","Physics, Applied
Journal title
ISSN journal
10584587
Volume
14
Issue
1-4
Year of publication
1997
Pages
193 - 200
Database
ISI
SICI code
1058-4587(1997)14:1-4<193:IE-DAS>2.0.ZU;2-U
Abstract
The densification behavior of sol-gel derived thin layers was examined . Two model systems were chosen: an acetate/alkoxide (lead titanate) a nd an alkoxide/alkoxide (lithium niobate) system. Drying, pyrolysis an d shrinkage which occur on heat treatment were systematically analysed by in-situ ellipsometry and stress measurements. A linear shrinkage o f similar to 40% was observed normal to the substrate with little chan ge in thickness above 200-250 degrees C. The shrinkage behavior was di fferent from bulk gels. The large stresses which developed on heating and cooling in thin-layer form result from drying of the constrained l ayer, shrinkage during pyrolysis and from thermal expansion mismatch b etween the deposited layer and the substrate. The evolution of stress is discussed in terms of shrinkage data, and differences between the t wo material systems are reported.