Ss. Sengupta et al., INTEGRATED ELECTROCERAMICS - DENSIFICATION AND STRESS DEVELOPMENT IN SOL-GEL DERIVED THIN-LAYERS, Integrated ferroelectrics, 14(1-4), 1997, pp. 193-200
The densification behavior of sol-gel derived thin layers was examined
. Two model systems were chosen: an acetate/alkoxide (lead titanate) a
nd an alkoxide/alkoxide (lithium niobate) system. Drying, pyrolysis an
d shrinkage which occur on heat treatment were systematically analysed
by in-situ ellipsometry and stress measurements. A linear shrinkage o
f similar to 40% was observed normal to the substrate with little chan
ge in thickness above 200-250 degrees C. The shrinkage behavior was di
fferent from bulk gels. The large stresses which developed on heating
and cooling in thin-layer form result from drying of the constrained l
ayer, shrinkage during pyrolysis and from thermal expansion mismatch b
etween the deposited layer and the substrate. The evolution of stress
is discussed in terms of shrinkage data, and differences between the t
wo material systems are reported.