DIELECTRIC-BREAKDOWN STRENGTH IN SOL-GEL DERIVED PZT THICK-FILMS

Dielectric DC breakdown strengths of ferroelectric lead zirconate tita nate (PZT) thick films are examined with respect to the film thickness , top electrode area, and grain size. The breakdown strengths of PZT(5 2/48) films are as much as two times higher than the predicted values empirically derived from bulk ceramics by earlier researchers. I-V cha racteristics show three distinct conduction mechanisms on 8 mu m PZT f ilms. Samples aged in air for one year show lower breakdown strengths, higher leakage currents, and higher onset voltages of the space-charg e-limited conduction (SCLC) mechanism.