O. Auciello, A CRITICAL COMPARATIVE REVIEW OF PZT AND SBT-BASED SCIENCE AND TECHNOLOGY FOR NONVOLATILE FERROELECTRIC MEMORIES, Integrated ferroelectrics, 15(1-4), 1997, pp. 211-220
A critical comparison is made between the two leading material technol
ogies being developed for the first generation of non-volatile ferroel
ectric memories. One of them is based on Pb(ZrxTi1-x)O-3 (PZT) and the
other on a layered perovskite family of materials, of which the most
intensively investigated is Sr1-xBi2+yTa2O9 (SET). Basic scientific an
d technological issues, related to the synthesis of thin films and com
position-microstructure-property relationships, are discussed in view
of materials integration strategies developed to produce capacitors wi
th properties suitable for commercial nonvolatile ferroelectric memori
es.