K. Amanuma et T. Kunio, ELECTRICAL CHARACTERIZATION OF SRBI2TA2O9 CAPACITORS FOR NONVOLATILE MEMORY OPERATION, Integrated ferroelectrics, 16(1-4), 1997, pp. 175-182
Pulse response of SrBi2Ta2O9 capacitors was measured for large-scale n
on-volatile memory design. Pulse response depended on capacitor size,
while such a dependence was not observed in hysteresis measurement. As
the reference capacitor in the Sawyer-Tower circuit decrease, the sig
nal voltage This result suggests small bit-line capacitor is preferabl
e for memory design. The possibility of very low-voltage operation was
indicated.