M. Gajdardziskajosifovska et al., ACCURATE MEASUREMENTS OF MEAN INNER POTENTIAL OF CRYSTAL WEDGES USINGDIGITAL ELECTRON HOLOGRAMS, Ultramicroscopy, 50(3), 1993, pp. 285-299
The mean inner potential of a solid is a fundamental property of the m
aterial and depends on both composition and structure. By using cleave
d crystal wedges of known angle, combined with digital recording of of
f-axis electron holograms and with theoretical calculations of dynamic
al effects, the mean inner potential of Si (9.26+/-0.08 V), MgO (13.01
+/-0.08 V), GaAs (14.53+/-0.17 V) and PbS (17.19+/-0.12 V) is measured
with high accuracy of about 1%. Dynamical contributions to the phase
of the transmitted beam are found by Bloch wave calculations to be les
s than 5% when the crystal wedges are tilted away from zone-axis orien
tations and from major Kikuchi bands. The accuracy of the present meth
od is a factor of 3 better than previously achieved by reflection high
-energy electron diffraction and electron interferometry. The major ca
uses of uncertainty were specimen imperfections and errors in phase me
asurement and magnification calibration.