ACCURATE MEASUREMENTS OF MEAN INNER POTENTIAL OF CRYSTAL WEDGES USINGDIGITAL ELECTRON HOLOGRAMS

Citation
M. Gajdardziskajosifovska et al., ACCURATE MEASUREMENTS OF MEAN INNER POTENTIAL OF CRYSTAL WEDGES USINGDIGITAL ELECTRON HOLOGRAMS, Ultramicroscopy, 50(3), 1993, pp. 285-299
Citations number
36
Categorie Soggetti
Microscopy
Journal title
ISSN journal
03043991
Volume
50
Issue
3
Year of publication
1993
Pages
285 - 299
Database
ISI
SICI code
0304-3991(1993)50:3<285:AMOMIP>2.0.ZU;2-E
Abstract
The mean inner potential of a solid is a fundamental property of the m aterial and depends on both composition and structure. By using cleave d crystal wedges of known angle, combined with digital recording of of f-axis electron holograms and with theoretical calculations of dynamic al effects, the mean inner potential of Si (9.26+/-0.08 V), MgO (13.01 +/-0.08 V), GaAs (14.53+/-0.17 V) and PbS (17.19+/-0.12 V) is measured with high accuracy of about 1%. Dynamical contributions to the phase of the transmitted beam are found by Bloch wave calculations to be les s than 5% when the crystal wedges are tilted away from zone-axis orien tations and from major Kikuchi bands. The accuracy of the present meth od is a factor of 3 better than previously achieved by reflection high -energy electron diffraction and electron interferometry. The major ca uses of uncertainty were specimen imperfections and errors in phase me asurement and magnification calibration.