YOUNG INTERFERENCE-FRINGES IN ELECTRON-MICROSCOPY REVISITED

Authors
ZEMLIN F WEISS K
Citation
F. Zemlin et K. Weiss, YOUNG INTERFERENCE-FRINGES IN ELECTRON-MICROSCOPY REVISITED, Ultramicroscopy, 50(2), 1993, pp. 123-126
Citations number
7
Categorie Soggetti
Microscopy
Journal title
Ultramicroscopy → ACNP
ISSN journal
03043991
Volume
50
Issue
2
Year of publication
1993
Pages
123 - 126
Database
ISI
SICI code
0304-3991(1993)50:2<123:YIIER>2.0.ZU;2-9
Abstract
Young's interference fringes (YIF) have long been known as a helpful t ool in image processing of electron micrographs by laser optics or com puter. In this paper, the usefulness of the YIF method is given a crit ical look.