ON A HIGH-PURITY GE EDS DETECTOR .3. THE RELIABLE ACQUISITION OF EDS SPECTRA

Authors
FOITZIK AH XIAO SQ HEUER AH WUNDERLICH W
Citation
Ah. Foitzik et al., ON A HIGH-PURITY GE EDS DETECTOR .3. THE RELIABLE ACQUISITION OF EDS SPECTRA, Ultramicroscopy, 50(2), 1993, pp. 229-235
Citations number
16
Categorie Soggetti
Microscopy
Journal title
Ultramicroscopy → ACNP
ISSN journal
03043991
Volume
50
Issue
2
Year of publication
1993
Pages
229 - 235
Database
ISI
SICI code
0304-3991(1993)50:2<229:OAHGED>2.0.ZU;2-5
Abstract
The factors concerning reliable acquisition of EDS spectra to be used for light-element analysis, particularly condenser aperture size, abso rption effects, and mass loss during specimen preparation or data acqu isition, are discussed. Absorption effects are the most serious for qu antitative analysis, and indicate the need for TEM foil thicknesses co mparable to those needed for HREM or EELS analysis.