In contrast to conventional length interferometry with frequency stabi
lized helium-neon-lasers the absolute interferometry with tunable semi
conductor lasers renders possible to detect distances in a static way
without moving the measuring reflector. All commercial laser interfero
meters are only able to measure changes in the pathlengh of the interf
erometer. So the starting point of the measurement, to that the follow
ing measurement results are related, is unknown. An interruption of th
e laserbeam stops a measurement, because the relation to the preceding
measurement results are irrecoverably lost. The report describes an a
bsolute interferometric process, which causes a change of interference
phase by continuous tuning of the wavelength of a semiconductor laser
. This change of phase is related to that of an reference interferomet
er with constant length. With the knowledge of the reference length th
e absolute distance can be calculated.