CORRELATION OF REFLECTION ELECTRON-DIFFRACTION PATTERNS, RAMAN-SPECTRA AND COMPOSITIONS IN CUINSE2 FILMS

Quantitative analysis was performed on epitaxial or oriented ''CuInSe2 '' grown on (001) GaAs (or GaP), which gave five types of reflection e lectron diffraction (RED) patterns. The compositions of ''CuInSez'' co uld be grouped into four classes corresponding to the types of RED pat terns observed. CuInSe2 satisfying stoichiometry belonged to the cubic system (space group, <P(4)over bar 3m>). The RED pattern of ''CuInSe2 '' including Se above 68 mol% could be explained by the superimpositio n of the RED patterns due to chalcopyrite-type CuInSe2 (s.g., <I(4)ove r bar 2d>) and an unknown tetragonal crystal (s.g., <I(4)over bar 2c>) . The RED pattern of CuInSe2 defined as chalcopyrite-type (001) CuInSe 2 accompanied a non-allowed (006)spot along the <[(1)over bar 00]> azi muth.